Test SIM - Test USIM, (U) SIM Editor

Overview

Handset

Smart Card

Contactless

Test(U)Sims

Just-in-time ordering
We offer a wide range of state-of-the-art standard Test (U)SIMs. Our test cards are also available in smaller quantities – or in bulk depending on your needs.

Customised? No problem
Once you reach a certain number of test cards, designing your own card might be an interesting option. Our Product Managers would be happy to help. Why not give us a call?

Additional tools
We also offer tools to edit our test cards – a SIM Editor for GSM Test SIMs and a USIM Editor for 3G Test USIMs. Of course it goes without saying that we offer a full range of support to help you in selecting and using our tools and systems.

Product Listing Table

GSM

	8K GSM Phase 2 Test SIM
		Prod. No.: 10208007 Phase 2 data fields 3V / 5V technology XOR test algorithm 8K EEPROM PIN 1 disabled
	32K GSM Phase 2+
		Standard 1 Test SIM Prod. No.: 10332001 Phase 2+ data fields 3V / 5V technology XOR test algorithm 32K EEPROM PIN 1 enabled OTA, CPHS and GPRS Functionality, Fast I/O Creation of new data fields allowed
	32K/J GSM Phase 2+ Test SIM
		with the SAT Test & Demo Applet “Proactive Commands” Prod. No.: 10332004 Phase 2+ data fields 3V / 5V technology Java Card™ XOR test algorithm 32K EEPROM PIN 1 enabled OTA Functionality, Fast I/O Creation of new data fields allowed SAT Test & Demo Applet Encoded icon
	64K/J GSM Phase 2+
		1.8V Test SIM (UICC) Prod. No.: 10332005 Phase 2+ data fields 1.8V / 3V / 5V technology Java Card™ XOR test algorithm 64K EEPROM PIN 1 disabled OTA, CPHS and GPRS Functionality, Fast I/O Creation of new data fields allowed

	64K/J Test (U)SIM 1.8V
		Prod. No.: 10432002 UICC multi-application platform Two applications: Test SIM and Test USIM Based on Java Card™ Open Platform technology 1.8V / 3V / 5V 64K EEPROM APIN 1 disabled OTA and GPRS Functionality, Fast I/O Creation of new data fields allowed
	128K/J Test (U)SIM T=1 Protocol
		Prod. No.: 10432003 UICC multi-application platform Two applications: Test SIM and Test USIM Based on Java Card™ Open Platform technology 3V / 5V 128K EEPROM APIN 1 disabled OTA and GPRS Functionality, Fast I/O Creation of new data fields allowed T=0 and T=1 protocol supported
	64K/J Test (U)SIM 1.8V – Mini-UICC
		Prod. No.: 10432004 UICC multi-application platform Two applications: Test SIM and Test USIM Based on Java Card™ Open Platform technology 1.8V / 3V / 5V 64K EEPROM APIN 1 disabled OTA and GPRS Functionality, Fast I/O Creation of new data fields allowed Mini-UICC: the 3rd Form Factor (3FF) – half the size compared to the Plug-in card

Click for world wide contacts

	Technical Contact
	Daniela Wittkamp Product Manager Fon.: +49 (0) 5251 699 86 62 Fax.: +49 (0) 5251 699 86 99 E-mail: dwittkamp@comprion.com

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