About

SWP/HCI

The Single Wire Protocol (SWP) is used for Near Field Communication (NFC) as the interface between the SIM card as the secure element and the contactless front-end (CLF) chip. The CLF connects the mobile phone with NFC cards, tags, and devices. The Host Controller Interface (HCI) acts as a further Bluetooth interface transmitting status and control functions. For comprehensive NFC testing, it is indispensable that the contactless and the contact-based interfaces of the CLF are tested simultaneously.

Bringing Know-How and Expertise to SWP/HCI Testing

Since the very beginning of the technical specification of the contactless smart card interface, the SWP/HCI protocol, COMPRION has been at the forefront of testing the so-called ‘Single Wire Protocol’ including the HCI layer running on top of SWP.

To date, COMPRION has constantly extended and refined this approach and can offer a wide portfolio of reliable solutions for SWP/HCI testing.

Products & Solutions

SWP/HCI Testing

UT³ Platform

UT³ Platform

The universal conformance platform for contact-based and contcatless terminal testing

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Prove 2

Prove 2

The comprehensive terminal test tool for all smart card interfaces

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Spectro TP

Spectro TP

The validated conformance platform for smart card testing

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Spectro 2

Spectro 2

The terminal simulator for smart card testing and tracing

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Move 2

Move 2

The high-end communication tracer for all smart card interfaces

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MiniMove

MiniMove

The pocket tracer for all smart card interfaces

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Overview

Comparing COMPRION SWP/HCI Test Systems

Terminal TestingUT³ PlatformProve 2CL Verify A
Conformance
GCF/PTCRB-validated test platform
Test Benches
ETSI TS 102 694-1 (SWP)all stagesstage 1,2 & 4stage 2 & 4
ETSI TS 102 695-1 /-3 (HCI)all stagesstage 1-4stage 2-4
GSMA TS.27 NFC Handset Test Book – SWP Stress Test
Capabilities
Electrical simulation of SWP
Digital simulation and protocol testing of SWP/HCI
Calibrated device for analog value measurements
Signal analysis with integrated digital oscilloscope
Monitoring/tracing of digital signals
Host PC and touch screen integrated

Card TestingSpectro TPSpectro 2
Test Benches
ETSI TS 102 694-2 SWP
ETSI TS 102 695-2 HCI
Capabilities
Test Case API for writing individual test cases
Digital simulation and protocol testing of SWP/HCI
Calibrated device for analog value measurement
Signal analysis with integrated digital oscilloscope
Monitoring/tracing of digital signals
Host PC and touch screen integrated

Interoperability TestingMiniMoveMove 2
Capabilities
Monitoring/tracing of digital signals (contact-based)
Signal analysis with integrated digital oscilloscope
USB power supply by host PC

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