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Interfaces & Technologies

Mobile connectivity is omnipresent in almost every part of modern life. An increasing number of interfaces is connecting more and more different technologies which all have to work seamlessly together. COMPRION offers test solutions for all relevant interfaces and technologies.

About

SWP/HCI

The Single Wire Protocol (SWP) is used for Near Field Communication (NFC) as the interface between the SIM card as the secure element and the contactless front-end (CLF) chip. The CLF connects the mobile phone with NFC cards, tags, and devices. The Host Controller Interface (HCI) acts as a further Bluetooth interface transmitting status and control functions. For comprehensive NFC testing, it is indispensable that the contactless and the contact-based interfaces of the CLF are tested simultaneously.

Bringing Know-How and Expertise to SWP/HCI Testing

Since the very beginning of the technical specification of the contactless smart card interface, the SWP/HCI protocol, COMPRION has been at the forefront of testing the so-called ‘Single Wire Protocol’ including the HCI layer running on top of SWP.

To date, COMPRION has constantly extended and refined this approach and can offer a wide portfolio of reliable solutions for SWP/HCI testing.

Products & Solutions

SWP/HCI Testing

UT³ Platform

UT³ Platform

The universal conformance platform for contact-based and contcatless terminal testing

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Prove 2

Prove 2

The comprehensive terminal test tool for all smart card interfaces

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Spectro TP

Spectro TP

The validated conformance platform for smart card testing

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Spectro 2

Spectro 2

The terminal simulator for smart card testing and tracing

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Move 2

Move 2

The high-end communication tracer for all smart card interfaces

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MiniMove

MiniMove

The pocket tracer for all smart card interfaces

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Overview

Comparing COMPRION SWP/HCI Test Systems

Terminal TestingUT³ PlatformProve 2CL Verify A
Conformance
GCF/PTCRB-validated test platform
Test Benches
ETSI TS 102 694-1 (SWP)all stagesstage 1,2 & 4stage 2 & 4
ETSI TS 102 695-1 /-3 (HCI)all stagesstage 1-4stage 2-4
GSMA TS.27 NFC Handset Test Book – SWP Stress Test
Capabilities
Electrical simulation of SWP
Digital simulation and protocol testing of SWP/HCI
Calibrated device for analog value measurements
Signal analysis with integrated digital oscilloscope
Monitoring/tracing of digital signals
Host PC and touch screen integrated

Card TestingSpectro TPSpectro 2
Test Benches
ETSI TS 102 694-2 SWP
ETSI TS 102 695-2 HCI
Capabilities
Test Case API for writing individual test cases
Digital simulation and protocol testing of SWP/HCI
Calibrated device for analog value measurement
Signal analysis with integrated digital oscilloscope
Monitoring/tracing of digital signals
Host PC and touch screen integrated

Interoperability TestingMiniMoveMove 2
Capabilities
Monitoring/tracing of digital signals (contact-based)
Signal analysis with integrated digital oscilloscope
USB power supply by host PC
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