Modular Contactless Testing Component

The CL Wave is COMPRION’s latest general-purpose test and measurement platform. Designed as a modular and future-proof platform, it enables the upgrade of existing systems to address evolving testing needs, including EMVCo PCD Analog requirements, without the need for a complete system replacement. Initially, the CL Wave can be ordered with an NFC module specifically for EMVCo PCD Analog testing, covering the latest IQ modulation test cases.

Integrated with the UT³ Platform, CL Wave operates within a safety cell combined with an industrial robot tailored for laboratory environments for EMVCo conformance testing. For pre-conformance testing, the CL Wave can complement a CL Verify A based test solution, offering a cost-efficient alternative, running the same test cases on non-validated hardware— making it an ideal choice for manufacturers preparing for certification.

 

COMPRION Test Solutions Using CL Wave

EMVCo L1 Test Solutions

Test solutions for EMVCo qualified contactless L1 certification testing.

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Input Channels

  • 14-Bit resolution; 125 MHz ADC sample rate; max. input voltage 48 Vpp at 50 ?; full scale 25 mVpp to 20 Vpp at 50 ?
  • Input connectors “M” and “R” via SW selection
  • M / R: measuring input for NFC signals
    • High dynamic range
    • Automatic Gain Control
    • Carrier frequency synchronization
    • Record length up to 128 M samples
    • Time measurement resolution: 8ns

Output Channel

  • 14-Bit resolution; 125 MHz
  • T (Terminal): Reader simulation up to 34Vpp at 50R
    • ISO/IEC 14443, ISO/IEC 18092, ISO/IEC 15693
    • NFC Forum
    • EMVCO 
  • C (Card): Card simulation
    • ISO/IEC 14443, ISO/IEC 18092, ISO/IEC 15693
  • P (Preamplifier): For external RF power amplifier
    • Output voltage 140mVpp – 5Vpp at 50R

 

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