128K/J LTE MILENAGE Test (U)SIM - 4FF


  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • MILENAGE algorithm
  • Creation of new data fields allowed
  • 4FF (nano)
128K/J LTE MILENAGE Test (U)SIM - 4FF
Art. No. 10532001
Dimension 85 mm x 54 mm

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