Test SIM

128K/J Test CSIM/Test (U)SIM – 4FF


  • UICC multi-application platform
  • Five applications: Test R-UIM, Test CSIM, Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • Cave/GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)
    • 128K/J Test CSIM/Test (U)SIM – 4FF
      Art. No. 10542003
      Dimension 85 mm x 54 mm
      Original Format No
      Target Format No
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