Test SIM

64K/J LTE Test (U)SIM – Plug-in – M2M UICC


  • UICC multi-application platform
  • New LTE data fields implemented
  • Two applications: Test SIM, Test USIM
  • Based on Java Card Open Platform technology
  • 1.8 V / 3 V / 5 V
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in)
64K/J LTE Test (U)SIM – Plug-in – M2M UICC
Art. No. 10432008
Dimension 85mm x 54mm
Original Format ID-1
Target Format No
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