At the GCF Combined Agreement Group meeting #46, taking place in New Jersey on April 26-27, 2016, the new WI-236 was introduced by GCF. The new work item refers to the GSMA TS.27 NFC Handset Test Book and covers testing standards for the launch of globally reliable NFC services on mobile phones.
At the same meeting, COMPRION has introduced its NFC Forum Analog Test Solution as a new test platform – TP 197 – which has been accepted by GCF. The new platform provides testing capabilities for the new WI-236, namely the RF characteristics of the NFC interface according to the requirements of the NFC Forum. The NFC Forum Analog Test Solution consists of UT³ Platform, a Kawasaki industrial robot in a safety cell, and different NFC Forum Reference Antennas.
The activation of WI-236 is expected to take place during the CAG#47 meeting in June 2016.
COMPRION has successfully achieved EMVCo qualification for its PCD Digital Test Solution in accordance with the latest EMVCo 3.2a specification. This…
COMPRION has expanded its analog test bench portfolio in accordance with ETSI TS 102 230-1 to include the new voltage class, Class D (1.2 volts) – a…
If you cannot find what you are looking for, leave us a note and we will get back to you as soon as possible.