Press Releases

www.comprion.com

May 14, 2013

COMPRION Launches a New Test Card for Evaluating Mobile Device Behaviour in Extreme Temperatures

With the increase of M2M (Machine to Machine) communication, mobile device requirements are increasing as well. COMPRION’s new test card helps confirm the proper functioning of mobile phones in extreme temperature zones, from the Arctic to the Sahara.

M2M UICCs are perfect for devices that must perform in rough environments and meet extended lifetime expectations. Such devices can be used anywhere on earth, i.e. making a call from a car in the middle of the desert, or sending data from an Arctic weather station.

The new 64K/J LTE Test (U)SIM – M2M UICC examines mobile device behaviour at temperatures between -40 °C to +105 °C, instead of the previously-required -25 °C to +85 °C. Thus, the card meets the ETSI specification TS 102 671.

Additionally, the M2M Test (U)SIM includes new LTE data fields and carries a GSM and a USIM application. The card supports 1.8V, 3V and 5V voltage classes and is available in the Plug-In/2FF format.

For more information, please visit out Test (U)SIM website.


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