Products & Solutions

UT³ Platform

The universal conformance test platform for contact-based and contactless terminal testing

  • One single platform for synchronized testing of all UICC and NFC interfaces
  • Stand-alone operation and synchronization with network simulators (COMPRION SIMfony)
  • GCF, PTCRB, EMVCo, and NFC Forum conformance platform
  • Wide range of conformance test cases for USIM/USAT, SWP, HCI, NFC, and EMV
  • Test and simulation of NFC-enabled devices and tags
  • Powerful analyzers for timing measurements and error identification 
  • Synchronized tracing of the contactless and the UICC interface
  • Integrated oscilloscope
  • Overview
  • Test Benches
  • Accessories

All-Inclusive Conformance Test Platform

Conformance testing is key to global interoperability. More and more complex test setups have to be passed before the successful market launch of a product. UT³ Platform simplifies and accelerates conformance testing of terminals as an all-inclusive test solution for both contact and contactless technologies.

Our UT³ Platform covers a wide area of use cases:

  • Conformance and regression testing of mobile phones
  • Interoperability testing of terminals and smart cards
  • Development/debugging of mobile phones and chipsets
    • Contactless terminals/readers
    • Banking terminals
    • NFC-enabled devices
    • Contactless front-ends (CLFs)
    • M2M devices

COMPRION's user-friendly Device Test Center provides access to all functionalities of UT³ Platform.

COMPRION offers the NFC Test Designer to implement user-defined scenarios and test the device limits in the contactless environment (NFC Forum, EMVCo, ISO/IEC 18092, ISO/IEC 14443).


COMPRION Test Solutions Using UT³ Platform

NFC Forum Analog Test Solutions

Automated test solutions for NFC Forum-approved compliance testing.

Read more

EMVCo L1 Test Solutions

Test solutions for EMVCo qualified contactless L1 certification testing.

Read more

CEN TS 16794-2 Test Solutions

Automated solutions for testing according ISO and CEN standards.

Read more


Conformance test platforms for certification of mobile devices.

Read more


  • Supported smart card voltage: 1.2 V/1.8 V/3 V/5 V
  • Time measurement performance
    • Resolution (contactless): up to 1/(8fc)
    • Resolution (contact-based): 10 ns
  • Measurement units: etu, second, CLK cycle
  • Time-synchronization interfaces
    • High-speed COMPRION SyncBus
    • Trigger out: connection between Analog Scope and external oscilloscope (1 V signal level at 50 Ohm)
  • PCD output
    • Pmax 1 W into 50 Ohm impedance
    • Frequency range 13.56 MHz ± 3.75 MHz
    • Frequency resolution < 24 mHz
  • Ambient temperature range: 20°C - 26°C
  • Required relative humidity of 40% ±20%


  • W x D x H: 450 x 375 x 175mm
  • 3GPP TS 51.010-1 SIM
  • 3GPP TS 51.010-4 SAT
  • 3GPP TS 31.121 USIM
  • 3GPP TS 31.124 USAT
  • EMVCo PICC L1 Analog
  • EMVCo PICC L1 Digital
  • EMVCo PCD L1 Analog
  • EMVCo PCD L1 Digital
  • EMVCo Terminal Level 1 Protocol
  • EMVCo Terminal Level 1 Electrical
  • ETSI TS 102 230-1
  • ETSI TS 102 922-1 IC-USB
  • ETSI TS 102 384 Smart Card Web Server
  • ETSI TS 102 694-1 SWP
  • ETSI TS 102 695-1 HCI
  • ETSI TS 102 695-3 HCI
  • GlobalPlatform SEAC Device
  • GlobalPlatform OMAPI
  • GSMA TS.27 Android Specific
  • GSMA TS.27 BIP
  • GSMA TS.27 Card Emulation
  • GSMA TS.27 General Device Support
  • GSMA TS.27 NFC Tags
  • GSMA TS.27 Remote Management
  • GSMA TS.27 SWP Stress
  • GSMA TS.27 UI Application Triggering
  • ISO 10373-6 PICC Analog (CEN TS 16794-2)
  • ISO 10373-6 PICC Digital (CEN TS 16794-2)
  • ISO 10373-6 PCD Analog (CEN TS 16794-2)
  • ISO 10373-6 PCD Digital(CEN TS 16794-2)
  • NFC Forum Digital Protocol
  • NFC Forum Tag Operation
  • NFC Forum Tag Performance
  • NFC Forum LLCP
  • NFC Forum SNEP
  • NFC Forum RF Analog
  • VZW LTE Test plan for USIM/USAT/ISIM
Art.-No. 20300002

Show details

Contact us!

If you cannot find what you are looking for, leave us a note and we will get back to you as soon as possible.