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sales@comprion.com

Test SIMs

If you need a high-quality smart card for testing purposes, then we are pleased to offer you our top-selling Test (U)SIMs. The smart cards are ready for use, but you can also configure them easily and adopt them to your needs.

Our Test (U)SIMs enable the user to comprehensively examine the functionalities of a mobile device and the correct interaction with the card without having access to a live network. Some of the biggest customer groups are handset manufacturers, test and system houses, and mobile phone repair companies.

 

  • 2G Test SIMs
  • 3G Test USIMs
  • 4G Test USIMs
  • Test CSIMs
  • File Tree Express
  • Accessories

XOR Test Algorithm

XOR Test Algorithm

8K GSM Phase 2 Test SIM

Prod. No.: 10208007
  • Phase 2 data fields
  • 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • XOR test algorithm
  • 8K EEPROM
  • PIN 1 disabled
  • 2FF (plug-in)

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XOR Test Algorithm

XOR Test Algorithm

32K GSM Phase 2+ Standard 1 Test SIM

Prod. No.: 10332001
  • Phase 2+ data fields
  • 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • XOR test algorithm
  • 32K EEPROM
  • PIN 1 enabled
  • Creation of new data fields allowed
  • 2FF (plug-in)

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XOR Test Algorithm

XOR Test Algorithm

64K/J GSM Phase 2+ 1.8 V Test SIM

Prod. No.: 10332005
  • Phase 2+ data fields
  • 1.8 V / 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • Java CardTM
  • XOR test algorithm
  • 64K EEPROM
  • PIN 1 disabled
  • Creation of new data fields allowed
  • 2FF (plug-in)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

64K/J Test (U)SIM – Plug-in

Prod. No.: 10432002
  • UICC multi-application platform
  • Two applications: Test SIM and Test USIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

64K/J Test (U)SIM – Mini-UICC

Prod. No.: 10432004
  • UICC multi-application platform
  • Two applications: Test SIM and Test USIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC) 
  • Repluggable card

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE CTS Test (U)SIM – 4FF

Prod. No.: 10432009
  • ARF support for CTS tests
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

64K/J LTE Test (U)SIM – Plug-in – M2M UICC

Prod. No.: 10432008
  • UICC multi-application platform
  • New LTE data fields implemented
  • Two applications: Test SIM, Test USIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature (TB) –40°C to +105°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE Test (U)SIM – 4FF

Prod. No.: 10432007
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

Show details

GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE Test (U)SIM – Mini-UICC

Prod. No.: 10432006
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC)
  • Repluggable card

Show details

GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE Test (U)SIM – Plug-in

Prod. No.: 10432005
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed 
  • 2FF (plug-in)

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Milenage Algorithm

Milenage Algorithm

128K/J LTE MILENAGE Test (U)SIM – Mini-UICC

Prod. No.: 10532000
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • MILENAGE algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC) 
  • Repluggable card

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Milenage Algorithm

Milenage Algorithm

128K/J LTE MILENAGE Test (U)SIM – 4FF

Prod. No.: 10532001
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • MILENAGE algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

Cave Algorithm

Cave Algorithm

128K/J Test CSIM/Test (U)SIM – Mini-UICC

Prod. No.: 10542002
  • UICC multi-application platform
  • Five applications: Test R-UIM, Test CSIM, Test SIM, Test USIM, Test ISIM 
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • Cave/GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC)
  • Repluggable card

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Cave Algorithm

Cave Algorithm

128K/J Test CSIM/Test (U)SIM – 4FF

Prod. No.: 10542003
  • UICC multi-application platform
  • Five applications: Test R-UIM, Test CSIM, Test SIM, Test USIM, Test ISIM 
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature   –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • Cave/GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

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We also offer software tools for editing our test cards:

  • File Tree Express Basic
  • File Tree Express Professional

Read more