Products & Solutions

Test SIMs

Portfolio of Test SIMs, Test USIMs and Test eSIMs

If you need a high-quality smart card for testing purposes, then we are pleased to offer you our top-selling Test SIMs, Test USIMs, and Test eSIMs:

  • Ready to use
  • Configurable
  • Available on stock
  • No minimum order quantity
  • Order easily via our web shop

Examine the functionalities of a device and the correct interaction with the card without having access to a live network.

 

  • 2G Test SIMs
  • 3G Test USIMs
  • 4G Test USIMs
  • Test CSIMs
  • Test eSIMs
  • File Tree Express
  • Accessories

XOR Test Algorithm

XOR Test Algorithm

8K GSM Phase 2 Test SIM

Prod. No.: 10208007
  • Phase 2 data fields
  • 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • XOR test algorithm
  • 8K EEPROM
  • PIN 1 disabled
  • 2FF (plug-in)

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XOR Test Algorithm

XOR Test Algorithm

32K GSM Phase 2+ Standard 1 Test SIM

Prod. No.: 10332001
  • Phase 2+ data fields
  • 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • XOR test algorithm
  • 32K EEPROM
  • PIN 1 enabled
  • Creation of new data fields allowed
  • 2FF (plug-in)

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XOR Test Algorithm

XOR Test Algorithm

64K/J GSM Phase 2+ 1.8 V Test SIM

Prod. No.: 10332005
  • Phase 2+ data fields
  • 1.8 V / 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • Java CardTM
  • XOR test algorithm
  • 64K EEPROM
  • PIN 1 disabled
  • Creation of new data fields allowed
  • 2FF (plug-in)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

64K/J Test (U)SIM – Plug-in

Prod. No.: 10432002
  • UICC multi-application platform
  • Two applications: Test SIM and Test USIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

64K/J Test (U)SIM – Mini-UICC

Prod. No.: 10432004
  • UICC multi-application platform
  • Two applications: Test SIM and Test USIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC) 
  • Repluggable card

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GSM XOR/3G test algorithm

GSM XOR/3G test algorithm

128K/J LTE Test (U)SIM – MFF2 - M2M UICC

Prod. No.: 10432010
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature (TB) –40°C to +105°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • MFF2 - M2M Form Factor #2 - 6x5mm
  • Native UICC (no eUICC)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE CTS Test (U)SIM – 4FF

Prod. No.: 10432009
  • ARF support for Android UICC Carrier Privileges CTS tests
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

64K/J LTE Test (U)SIM – Plug-in – M2M UICC

Prod. No.: 10432008
  • UICC multi-application platform
  • New LTE data fields implemented
  • Two applications: Test SIM, Test USIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature (TB) –40°C to +105°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE Test (U)SIM – 4FF

Prod. No.: 10432007
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE Test (U)SIM – Mini-UICC

Prod. No.: 10432006
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC)
  • Repluggable card

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE Test (U)SIM – Plug-in

Prod. No.: 10432005
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed 
  • 2FF (plug-in)

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Milenage Algorithm

Milenage Algorithm

128K/J LTE MILENAGE Test (U)SIM – Mini-UICC

Prod. No.: 10532000
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • MILENAGE algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC) 
  • Repluggable card

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Milenage Algorithm

Milenage Algorithm

128K/J LTE MILENAGE Test (U)SIM – 4FF

Prod. No.: 10532001
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • MILENAGE algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

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Cave Algorithm

Cave Algorithm

128K/J Test CSIM/Test (U)SIM – Mini-UICC

Prod. No.: 10542002
  • UICC multi-application platform
  • Five applications: Test R-UIM, Test CSIM, Test SIM, Test USIM, Test ISIM 
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • Cave/GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC)
  • Repluggable card

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Cave Algorithm

Cave Algorithm

128K/J Test CSIM/Test (U)SIM – 4FF

Prod. No.: 10542003
  • UICC multi-application platform
  • Five applications: Test R-UIM, Test CSIM, Test SIM, Test USIM, Test ISIM 
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature   –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • Cave/GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

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Test eSIMs

Test eSIMs

Test eUICC - M2M

Prod. No.: 10632000
  • Configured with Test Certificates and Test Keys
  • COMPRION Test Profile
  • USIM and ISIM application
  • 3G test algorithm
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 3FF (mini-UICC)

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Test eSIMs

Test eSIMs

Test eUICC - Consumer Device

Prod. No.: 10632001
  • Configured with Test Certificates and Test Keys according to the GSMA SGP.26 - RSP Test Certificates Definition Specification
  • No profile loaded
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • Triple Format 2FF (plug-in), 3FF (mini-UICC), 4FF (nano)

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We also offer software tools for editing our test cards:

  • File Tree Express Basic
  • File Tree Express Professional

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