Test SIM

32K GSM Phase 2+ Standard 1 Test SIM


  • Phase 2+ data fields
  • 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • XOR test algorithm
  • 32 K EEPROM
  • PIN 1 enabled
  • Creation of new data fields allowed
  • 2FF (plug-in)
32K GSM Phase 2+ Standard 1 Test SIM
Art. No. 10332001
Dimension 85 mm x 54 mm

Compatible Products

Icon
COMPRION Shop

Log in to see the prices, order the item or edit your account details.

Login

Icon
Support

Do you have any questions regarding our systems, technical issues or product related topics? Our support team will be quick to help you with straightforward assistance.

Read more