Products & Solutions

Interoperability Test Center

The best-in-class software for comprehensive data analysis with COMPRION test systems

  • Records, displays, and analyzes communication between smart card and terminal
  • Signal analysis with integrated oscilloscope
  • Monitoring and logfile generation
  • Outstanding graphical user interface
  • Overview


Interoperability Test Center is used for:

  • Interoperability testing (smart card/terminal for contact-based and contactless interfaces)
  • Development/debugging of
    • mobile phones/chipsets
    • smart cards
    • M2M devices
    • NFC-enabled devices, contactless terminals/readers and front-ends (CLFs)
    • NFC applications
    • contactless cards
    • RFID tags
  • Visualization and measurement of analog signals
  • Combined NFC/SWP/HCI testing
  • Quality assurance
  • Simultaneous test and analysis of UICC interfaces (ISO/IEC 7816, SWP/HCI, IC-USB) and contactless (NFC) interfaces
  • Field testing (mobile usage)


Efficient testing with multi-view screen UI

The Interability Test Center's user interface features a multi-view screen displaying multiple views simultaneously. Monitored data is promptly displayed during sessions for quick analysis. Synchronized views enable efficient testing and analysis of UICC interfaces (ISO/IEC 7816, SWP/HCI, IC-USB) and contactless (NFC) interfaces simultaneously.

Example of analyzing SWP combined with contactless communication

The monitoring session screenshot displays SWP alongside contactless communication. In the Physical Layer view, detailed bit and byte-level data within communication frames are visible for precise analysis, including time markers for precise measurements. The Protocol Layer view showcases exchanges occurring on ISO7816 or SWP/HCI interfaces. Additionally, the Application Layer offers real-time interpretation of commands spanning GSM, 3G, ISIM, CDMA, HCI, Global Platform, EMVCo, USB, SIM Toolkit (U)SAT, and Terminal Profile interpretations.

Troubleshooting with Analog Scope

The Analog Scope function is an additional feature for analyzing and troubleshooting signaling errors. It records and visualizes analog data, providing quick measurements of waveform characteristics with a single mouse click. Additionally, the Analog Scope Viewer allows evaluation of measurement results, including time intervals, to aid troubleshooting and assess IUT performance. Independent of test case execution, it can be used for discrete monitoring sessions. With predefined quick measurements, you gain valuable information on waveform characteristics and receive detailed comments explaining test failures.


Available for Following COMPRION Monitoring Tools


The pocket tracer for all smart card interfaces.

Read more

Move 2

The high-end communication tracer for all smart card interfaces.

Read more

CL Verify A

Contactless simulator and monitoring tool for testing of contactless cards, chips, and terminals.

Read more

Contact us!

If you cannot find what you are looking for, leave us a note and we will get back to you as soon as possible.