COMPRION - News

Certification

COMPRION PCD Analog Test Solution Qualified for EMVCo 3.0

Test tool provider COMPRION is proud to announce that their EMVCo conformance test system for contactless POS terminals has received the Letter of...

COMPRION EMVCo PICC Digital Test Solution Qualified for EMVCo 3.0

Today, test tool manufacturer COMPRION announces that their test system for approval of contactless means of payment, like cards, smartphones, and...

COMPRION First to Offer Validated PSM and eDRX Tests for Mobile IoT Devices

The validation of the PSM and eDRX tests on the COMPRION test platform has activated two new GCF work items. The tests become part of GCF...

COMPRION Launches First M2M Test eUICC for RSP Testing

In the future, we will see more and more M2M devices with an eSIM. To ensure that switching to another MNO and the related Remote SIM Provisioning...

COMPRION Webinars Educate in eSIM and RSP Technology

For everyone who just came across eSIM and Remote SIM Provisioning and wonders about the technologies’ impact on their business, COMPRION now offers a...

COMPRION Supports Paderborn Hackathon

Last weekend, the Paderborn Hackathon in the Heinz Nixdorf MuseumsForum took place for the third time. All in all, 70 pupils, apprentices, and...

COMPRION Welcomes New Apprentices

Welcome to the world of mobile communications: apprenticeship in three different jobs has started for five young people at the COMPRION GmbH...

COMPRION Summer Party Focused on Teamwork

Employees build XXL marble run with teamwork and creativity

Industry Insights

Interoperability Issues Due to Introduction of Chip-Based EMV Cards in the U.S.

Migration of magnetic stripe cards to new EMV chip cards leads to communication problems in the field

How to Prevent a Power Loss? The Power of Tearing Tests

Dr. Frank Oberhokamp, our expert on eUICCs and remote SIM provisioning, talks about the importance and the risk of insufficient testing.

How to Trigger on NFC Commands and Measure Timings

Often the biggest challenge when you analyze NFC is establishing proper trigger conditions that provide a stable display of waveforms. With...

How to Easily Define Measurement Volumes of NFC Readers

You intend to measure the magnetic field strength of an NFC reader. In order to obtain an accurate representation of the magnetic field, you need a...

How to Vastly Improve the Design of NFC Readers

Material, form, and coating of your NFC reader might have a negative impact on the performance. Now, you can thoroughly evaluate the magnetic field...

Anritsu and COMPRION Achieve eSIM OTA Test Solution Verification to Support ERA-GLONASS

Test Environment meeting GOST 33470 Chapter 9 specifications verified at Certification Centre Svyaz-sertificat in Russia

How to Switch to eSIM Successfully!

COMPRION has launched a new test system that eases the introduction of eSIM and RSP technology for enterprises.

COMPRION Launches First Test eUICC for Consumer Device and RSP Testing

The new COMPRION Consumer Device Test eUICC enables mobile phone manufacturers, MNOs, and infrastructure suppliers to examine the interplay between a...

Industry Insights

eSIM: How Likely Is Your Industry to Be Disrupted?

Hajo Sandschneider outlining the status quo of the eSIM during Mobile World Congress 2018 for Mobile World Live TV.

Mobile Kommunikation mit eSIM schafft Wettbewerbsvorteile

Materna und COMPRION vereinbaren Partnerschaft und unterstützen bei der Realisierung eSIM-basierter Projekte.

News Archive

Products & Solutions

Support

Services

Company

Certification

COMPRION PCD Analog Test Solution Qualified for EMVCo 3.0

COMPRION EMVCo PICC Digital Test Solution Qualified for EMVCo 3.0

Product

COMPRION First to Offer Validated PSM and eDRX Tests for Mobile IoT Devices

Product

COMPRION Launches First M2M Test eUICC for RSP Testing

Events

COMPRION Webinars Educate in eSIM and RSP Technology

COMPRION Supports Paderborn Hackathon

COMPRION Welcomes New Apprentices

COMPRION Summer Party Focused on Teamwork

Industry Insights

Interoperability Issues Due to Introduction of Chip-Based EMV Cards in the U.S.

Industry Insights

How to Prevent a Power Loss? The Power of Tearing Tests

How-To

How to Trigger on NFC Commands and Measure Timings

How to Easily Define Measurement Volumes of NFC Readers

How to Vastly Improve the Design of NFC Readers

Anritsu and COMPRION Achieve eSIM OTA Test Solution Verification to Support ERA-GLONASS

How to Switch to eSIM Successfully!

COMPRION Launches First Test eUICC for Consumer Device and RSP Testing

Industry Insights

eSIM: How Likely Is Your Industry to Be Disrupted?

Cooperations

Mobile Kommunikation mit eSIM schafft Wettbewerbsvorteile

Products & Solutions

Support

Services

Company

Shop Login

Certification

Product

Product

Events

Industry Insights

Industry Insights

How-To

Industry Insights

Cooperations

COMPRION NEWSLETTER