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File Tree Express

The easy-to-use software for viewing and editing data fields stored on smart cards

  • Supports 2G and 3G technologies with SIM, R-UIM, USIM, CSIM, and ISIM applications
  • Scans smart cards and saves their contents on disk for offline usage
  • Enables you to compare file trees and create your own file trees and scripts
  • Use Cases
  • Available Software Packages
  • Accessories

File Tree Express can be used for:

  • Scanning of smart cards
  • Creation of customized file trees
  • Updating of EF contents
  • Copy / paste of single EFs or a range of EFs to and from different file trees
  • Translation of EF contents
  • Comparison of different file trees
  • Creation of command sequences
  • Creation of personalization scripts
  • Viewing of APDUs during card scan or data update
  • Resizing of EFs
  • Export / import of file trees to/from different file formats (XML, Excel, UXP)

File Tree Express also offers:

  • Find / look-up functionality
  • Wizard for creating new files
  • Support of any PC/SC-compliant smart card reader
  • Comprehensive interface for viewing file access conditions
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Support

Do you have any questions regarding our systems, technical issues or product related topics? Our support team will be quick to help you with straightforward assistance.

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File Tree Express is available in two different versions:

File Tree Express Basic V2.1
Prod. No.: 20200107

File Tree Express Professional V2.1
Prod. No.: 20200108

File Tree Express Basic V2.1 File Tree Express Professional V2.1
Features
Scan Smart Card File Trees (SIM, R-UIM, USIM, ISIM, CSIM)
Edit File Trees (SIM, R-UIM, USIM, ISIM, CSIM)
Open/Save File Trees From/To Disc
Find/Look-Up Files
Copy/Paste EFs
EF Translator
File Tree Compare
Command Sequencer
APDU Viewer
Create/Delete File (EF, DF)
Resize File
Excel Import/Export
SIMpml (UXP) Import/Export (card body)
Create Personalization Scripts

To order one of the following update software packages please contact sales@comprion.com

  • File Tree Express Update (from Basic V2.0 to V2.1)
    Prod. No.: 20200109U

  • File Tree Express Update (from Professional V2.0 to V2.1)
    Prod. No.: 20200110U

For the operation of the File Tree Express software a PC/SC card reader is required:

  • Card Reader
    Prod. No.: 20100104 (see Accessories)

Accessories

8K GSM Phase 2 Test SIM
Art. No. 10208007


  • Phase 2 data fields
  • 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • XOR test algorithm
  • 8 K EEPROM
  • PIN 1 disabled
  • 2FF (plug-in)

Show details

32K GSM Phase 2+ Standard 1 Test SIM
Art. No. 10332001


  • Phase 2+ data fields
  • 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • XOR test algorithm
  • 32 K EEPROM
  • PIN 1 enabled
  • Creation of new data fields allowed
  • 2FF (plug-in)

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64K/J GSM Phase 2+ 1.8 V Test SIM
Art. No. 10332005


  • Phase 2+ data fields
  • 1.8 V / 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • Java Card™
  • XOR test algorithm
  • 64 K EEPROM
  • PIN 1 disabled
  • Creation of new data fields allowed
  • 2FF (plug-in)

Show details

64K/J Test (U)SIM – Plug-in
Art. No. 10432002


  • UICC multi-application platform
  • Two applications: Test SIM and Test USIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in)

Show details

64K/J Test (U)SIM 1.8 V – Mini-UICC
Art. No. 10432004


  • UICC multi-application platform
  • Two applications: Test SIM and Test USIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC)
  • Repluggable card

Show details

128K/J LTE Test (U)SIM – Plug-in
Art. No. 10432005


  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorith
  • Creation of new data fields allowed
  • 2FF (plug-in)
128K/J LTE Test (U)SIM – Mini-UICC
Art. No. 10432006


  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128 K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC)
  • Repluggable card

Show details

128K/J LTE Test (U)SIM – 4FF
Art. No. 10432007


  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java Card™ Open Platform technology
  • 1.8V / 3V / 5V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

Show details

64K/J LTE Test (U)SIM – Plug-in – M2M UICC
Art. No. 10432008


  • UICC multi-application platform
  • New LTE data fields implemented
  • Two applications: Test SIM, Test USIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature (TB) –40°C to +105°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in)

Show details

128K/J LTE MILENAGE Test (U)SIM – Mini-UICC
Art. No. 10532000


  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128 K EEPROM
  • APIN 1 disabled
  • MILENAGE algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC)
  • Repluggable card

Show details

128K/J Test CSIM/Test (U)SIM – Mini-UICC
Art. No. 10542002


  • UICC multi-application platform
  • Five applications: Test R-UIM, Test CSIM, Test SIM, Test USIM, Test ISIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • Cave/GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC)
  • Repluggable card
128K/J Test CSIM/Test (U)SIM – 4FF
Art. No. 10542003


  • UICC multi-application platform
  • Five applications: Test R-UIM, Test CSIM, Test SIM, Test USIM, Test ISIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • Cave/GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)
128K/J LTE CTS Test (U)SIM – 4FF
Art. No. 10432009


  • ARF support for CTS tests
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

Show details

128K/J LTE MILENAGE Test (U)SIM - 4FF
Art. No. 10532001


  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • MILENAGE algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

Show details