Test SIM

128K/J LTE Test (U)SIM – Plug-in


  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java Card Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorith
  • Creation of new data fields allowed
  • 2FF (plug-in)
    • 128K/J LTE Test (U)SIM – Plug-in
      Art. No. 10432005
      Dimension 85 mm x 54 mm
      Original Format ID-1
      Target Format No
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