Software for Testing SIMs, eSIMs and Remote SIM Provisioning
Use Cases Include:
Advanced Test Case Management Software for Smart Cards and eSIM Solutions
Connectivity Test Center is COMPRION’s test case management software for testing smart cards, secure elements (on-chip), and all entities involved in remote SIM provisioning (RSP) of embedded SIMs. It is perfectly suited for manufacturers of smart cards, chips, devices, and servers as well as network operators who need to validate their (e)UICC-based services and solutions. Additionally, it helps to comply with current international standards and supports product development by increasing resilience against real-world challenges.
As the adjacent graphic shows, Connectivity Test Center can communicate with soldered eUICCs, unsoldered SIMs and eSIMs as well as with RSP backend servers (SM-DP, SM-SR).
Test Plan Management
Connectivity Test Center provides a repository of available test benches from which you can select, and allows to create test plans tailored to your specific requirements. For each implementation under test (IUT), you can define a set of parameters that serve as input for the test procedure. Based on these parameters, only the relevant test cases from the selected test benches are executed, significantly reducing the number of test runs, overall test duration, and the time required for analyzing the results.
Test Reporting & Results
Once the test procedure is complete, the results of each individual test case are presented both separately and in a summary format. With a single click, you can access detailed results for any test case, including specific information about the error causes for failed tests. Additionally, you can show monitoring data that presents all communication data recorded during the test in separate views for easier interpretation. This is very helpful in troubleshooting when tests do not pass.
Unrivaled Look into Data Communication on All Layers
Monitoring by COMPRION means that the recorded data is processed in different layers. The complete data stream is available at a single glance, with bits and bytes translated into the appropriate format for all layers, so that the recorded data is easy to understand. Fast orientation in the recorded log file is made possible through the synchronization of individual layer views - selecting content within one layer automatically synchronizes the views of all layers. Additionally, zoom features provide detailed close-ups of incidents on the physical layer.
Our terminal simulator for smart card testing and tracing is the ideal companion for preparing for validation in the laboratory.
Our conformance platform for smart card testing with digital and analog test and measurement abilities - Qualified by GlobalPlatform.
M2M
Consumer Device
Your Ticket to the nuSIM Ecosystem - Functional nuSIM Testing
Did you know that nuSIM is an integrated SIM designed by Deutsche Telekom? It is targeted at low-cost IoT applications, all SIM functionality is coded into the IoT chip. This specific iSIM benefits from optimized space without physical SIM hardware. In addition, low power consumption prolongs life time. More important, simpler ways of handling profiles with operator data speed up roll out.
Deutsche Telekom has initiated the nuSIM and a complete ecosystem around it. The reason was the lack of a homogeneous platform offering all IoT functions without friction. The nuSIM initiative unites chipset manufacturers, modem vendors, operating system providers as well as IoT component OEMs in the nuSIM ecosystem.
Since many companies are involved, interoperability testing and certification have become mandatory. Consequently, COMPRION partnered to write a functional test specification.
COMPRION now provides the corresponding test tool to prove the compliance by nuSIM testing. The corresponding test bench runs on the test plan management software Connectivity Test Center. To prove proper network access, the R&S®CMW290 or R&S®CMW500 network simulator completes the setup as "callbox". It connects via local LAN to the software on the PC. Finally, a customer specific chip connector translates between the Device under Test = DUT and the test bench. As COMPRION supports with proven examples, adopting this interface is fast.
For further information, please contact us at sales(at)comprion.com
If you cannot find what you are looking for, leave us a note and we will get back to you as soon as possible.