The all-in-one control software for UT³ Platform, Prove 2, and CL Verify A
All-in-One Control Station
The complexity of the mobile ecosystem is continuously expanding, resulting in a greater need for comprehensive testing. As a result, the number of tests required to cover all relevant interfaces is also increasing. To address this challenge, COMPRION Device Test Center was specifically designed to simplify and accelerate your previously time-consuming testing efforts. Device Test Center is available for a wide range of COMPRION hardware, providing customers with versatile testing solutions that cater to their specific needs.
Use Cases Inlcude:
Test Plan Management
Configure and manage multiple Implementations Under Test (IUT) or Devices Under Test (DUT) with varying characteristics. Easily define parameters for each IUT and automate test case adaptation. Take advantage of comprehensive features for managing IUTs, including creating, duplicating, deleting, exporting, and importing. Streamline test setup management with integrated test plan functionality. Generate comprehensive test plans, automate plan generation based on IUT features, and effectively manage requirements, test plans, and test cases for efficient testing.
Test Reporting and Analysis
Device Test Center offers a comprehensive overview and detailed insights into all your test results. It provides numerous options to accelerate analysis and bug fixing, allowing you to view individual test results, customize analysis with step-by-step instructions, generate detailed test results or summary reports for an IUT or test plan, and create certification-specific test reports effortlessly.
Troubleshooting with Analog Scope
The Analog Scope function is an additional feature for analyzing and troubleshooting signaling errors. It records and visualizes analog data, providing quick measurements of waveform characteristics with a single mouse click. Additionally, the Analog Scope Viewer allows evaluation of measurement results, including time intervals, to aid troubleshooting and assess IUT performance. Independent of test case execution, it can be used for discrete monitoring sessions. With predefined quick measurements, you gain valuable information on waveform characteristics and receive detailed comments explaining test failures.
Monitoring Capabilities
Monitoring plays a crucial role in troubleshooting by providing essential insights into recorded data across different layers, facilitating efficient issue identification and resolution. Device Test Center displays monitoring results ain separate windows, providing interpretable information about the complete data stream. Synchronized views enable seamless navigation within the log file, while zoom features allow for a closer examination of incidents at the physical layer. As a result, troubleshooting is accelerated, leading to faster identification and resolution of issues and ultimately improving development processes.
| UT³ Platform | Prove 2 | |||
|---|---|---|---|---|
 |  |
| 3GPP TS 31.121 USIM | ||||
| 3GPP TS 31.124 USAT | ||||
| 3GPP TS 51.010-1 Analog |
| UT³ Platform | NFC Robot with UT³ Platform | CL Verify A | NFC Robot with CL Verify A | |
|---|---|---|---|---|
 |  |  | |
| EMVCo PICC Analog | qualified | |||
| EMVCo PICC L1 Digital | qualified | qualified | ||
| EMVCo PCD Analog | qualified | |||
| EMVCo PCD L1 Digital | qualified | qualified | ||
| EMVCo Terminal L1 Electrical | qualified | |||
| EMVCo Terminal L1 Protocol |
| UT³ Platform | Prove 2 | |||
|---|---|---|---|---|
| |
| ETSI TS 102 230 | ||||
| ETSI TS 102 384 CAT SWP HCI | ||||
| ETSI TS 102 694-1 SWP | ||||
| ETSI TS 102 695-1 HCI | ||||
| ETSI TS 102 695-3 HCI | ||||
| ETSI TS 102 922-1 IC-USB |
| UT³ Platform | Prove 2 | |||
|---|---|---|---|---|
| |
| GlobalPlatform SEAC Device | ||||
| GlobalPlatform OMAPI |
| UT³ Platform | Prove 2 | CL Verify A | ||
|---|---|---|---|---|
| | |
| GSMA TS.27 Android Specific | with CL Verify A | with Prove 2 | ||
| GSMA TS.27 BIP | ||||
| GSMA TS.27 Card Emulation | with CL Verify A | with Prove 2 | ||
| GSMA TS.27 General Device Support | with CL Verify A | with Prove 2 | ||
| GSMA TS.27 Multiple Card Emulation Environment | with CL Verify A | with Prove 2 | ||
| GSMA TS.27 NFC Tags | ||||
| GSMA TS.27 NFC Tag Performance | ||||
| GSMA TS.27 Remote Management | ||||
| GSMA TS.27 SEAC | with CL Verify A | with Prove 2 | ||
| GSMA TS.27 SWP Stress | ||||
| GSMA TS.27 UI Application Triggering | with CL Verify A | with Prove 2 |
| UT³ Platform | CL Verify A | NFC Robot | ||
|---|---|---|---|---|
| |  |
| ISO 10373-6 PICC Analog (CEN TS 16794-2) | recommended | |||
| ISO 10373-6 PICC Digital (CEN TS 16794-2) | ||||
| ISO 10373-6 PCD Analog (CEN TS 16794-2) | recommended | |||
| ISO 10373-6 PCD Digital (CEN TS 16794-2) |
| UT³ Platform | NFC Robot with UT³ Platform | CL Verify A | NFC Robot with CL Verify A | |
|---|---|---|---|---|
|  | | |
| NFC Forum Digital Protocol | ||||
| NFC Forum Logical Link Control Protocol | ||||
| NFC Forum RF Analog | ||||
| NFC Forum SNEP | ||||
| NFC Forum Tag | ||||
| NFC Forum Tag Performance |
| CL Verify A | ||||
|---|---|---|---|---|
|
| CCC DK E2E Interoperability |
See How to Automate Your Export of Test Results In Device Test Center in 1 Minute.
Do you know how easy it can be to start testing with the Device Test Center? Doesn´t matter what kind of device you are testing. IoT, Contactless, phones, eSIM, eUICC. It really isn´t a problem. The most important thing is that we don´t need to search through applicability tables anymore, since the Device Test Center is able to simply select all the applicable test cases that our device is supporting.
Automate Your Export of Test Results In Device Test Center
Quick Video, quick rundown of benefits: Save time because there is no Need for manual storage; Eliminate errors by using the copy paste principle; Feed data into existing tool chains for automated analysis. Interested?
If you cannot find what you are looking for, leave us a note and we will get back to you as soon as possible.
