64K/J Test (U)SIM 1.8 V – Mini-UICC
- UICC multi-application platform
- Two applications: Test SIM and Test USIM
- Based on Java Card™ Open Platform technology
- 1.8 V / 3 V / 5 V
- Temperature –25°C to +85°C
- 64K EEPROM
- APIN 1 disabled
- GSM XOR/3G test algorithm
- Creation of new data fields allowed
- 2FF (plug-in), 3FF (mini-UICC)
- Repluggable card
| 64K/J Test (U)SIM 1.8 V – Mini-UICC | |
|---|---|
| Art. No. | 10432004 |
| Dimension | 85 mm x 54 mm |
