Test SIM

128K/J LTE Test (U)SIM – 4FF


  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java Card Open Platform technology
  • 1.8V / 3V / 5V
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)
128K/J LTE Test (U)SIM – 4FF
Art. No. 10432007
Dimension 85mm x 54mm
Original Format ID-1
Target Format 2FF, 3FF, 4FF
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