128K/J LTE Test (U)SIM – 4FF

  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java Card™ Open Platform technology
  • 1.8V / 3V / 5V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)
128K/J LTE Test (U)SIM – 4FF
Art. No. 10432007
Dimension 85 mm x 54 mm

Compatible Products

Nano-UICC Adaptor 4FF to 3FF
Art. No. 11050007


Nano-UICC Adaptor 4FF to 2FF
Art. No. 11050006



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