128K/J LTE Test (U)SIM – 4FF
- UICC multi-application platform
- New LTE data fields implemented
- Three applications: Test SIM, Test USIM, Test ISIM
- Based on Java Card™ Open Platform technology
- 1.8V / 3V / 5V
- Temperature –25°C to +85°C
- 128K EEPROM
- APIN 1 disabled
- GSM XOR/3G test algorithm
- Creation of new data fields allowed
- 4FF (nano)
128K/J LTE Test (U)SIM – 4FF | |
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Art. No. | 10432007 |
Dimension | 85 mm x 54 mm |