64K/J GSM Phase 2+ 1.8 V Test SIM
- Phase 2+ data fields
- 1.8 V / 3 V / 5 V technology
- Temperature –25°C to +85°C
- Java Card™
- XOR test algorithm
- 64 K EEPROM
- PIN 1 disabled
- Creation of new data fields allowed
- 2FF (plug-in)
| 64K/J GSM Phase 2+ 1.8 V Test SIM | |
|---|---|
| Art. No. | 10332005 |
| Dimension | 85 mm x 54 mm |
