Test SIM

64K/J GSM Phase 2+ 1.8 V Test SIM


  • Phase 2+ data fields
  • 1.8 V / 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • Java Card™
  • XOR test algorithm
  • 64 K EEPROM
  • PIN 1 disabled
  • Creation of new data fields allowed
  • 2FF (plug-in)
64K/J GSM Phase 2+ 1.8 V Test SIM
Art. No. 10332005
Dimension 85 mm x 54 mm

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