Discover how to monitor, trace, and debug multiple active profiles with confidence.
With Multiple Enabled Profiles (MEP), eSIM architectures are becoming significantly more complex. Parallel profiles, dynamic switching, and increased signaling flows create new challenges for visibility and control.
In this webinar, we explore how MEP is transforming the way engineers monitor and analyze eSIM behavior—and how advanced tracing helps uncover what’s really happening inside the device and network.
What you will learn
What is MEP and why is this feature relevant now?
How can MEP be tested, and how is this done during development?
The value of comprehensive eSIM tracing and monitoring tools
Where is the industry heading – and what new use cases are emerging?
The complete set of slides as well as the transcribed Q&A session is available as a PDF file via email. You can obtain this by filling out the form on this page.
For more information about our eSIM tracing tool, visit the product page. Want to discuss this topic further? Reach out to our presenter Andras Talas at atalas@comprion.com.
If you cannot find what you are looking for, leave us a note and we will get back to you as soon as possible.
