128K/J LTE Test (U)SIM – MFF2 - M2M UICC

  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature (TB) –40°C to +105°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • MFF2 - M2M Form Factor #2 - 6x5mm
  • Native UICC (no eUICC)
128K/J LTE Test (U)SIM – MFF2 - M2M UICC
Art. No. 10432010
Dimension 6 mm x 5 mm
Icon
COMPRION Shop

Log in to see the prices, order the item or edit your account details.

Login

Icon
Support

Do you have any questions regarding our systems, technical issues or product related topics? Our support team will be quick to help you with straightforward assistance.

Read more

Download Brochure

You're almost there.
Fill out the form and we will send you the requested file by Email right away.