128K/J LTE Test (U)SIM – MFF2 - M2M UICC

128K/J LTE Test (U)SIM – MFF2 - M2M UICC
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature (TB) –40°C to +105°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • MFF2 - M2M Form Factor #2 - 6x5mm
  • Native UICC (no eUICC)
128K/J LTE Test (U)SIM – MFF2 - M2M UICC
Art. No. 10432010
Dimension 6 mm x 5 mm

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