128K/J LTE Test (U)SIM – MFF2 - M2M UICC
- UICC multi-application platform
- New LTE data fields implemented
- Three applications: Test SIM, Test USIM, Test ISIM
- Based on Java CardTM Open Platform technology
- 1.8 V / 3 V / 5 V
- Temperature (TB) –40°C to +105°C
- 128K EEPROM
- APIN 1 disabled
- GSM XOR/3G test algorithm
- Creation of new data fields allowed
- MFF2 - M2M Form Factor #2 - 6x5mm
- Native UICC (no eUICC)
| 128K/J LTE Test (U)SIM – MFF2 - M2M UICC | |
|---|---|
| Art. No. | 10432010 |
| Dimension | 6 mm x 5 mm |
