128K/J LTE Test (U)SIM – Mini-UICC
- UICC multi-application platform
- New LTE data fields implemented
- Three applications: Test SIM, Test USIM, Test ISIM
- Based on Java Card™ Open Platform technology
- 1.8 V / 3 V / 5 V
- Temperature –25°C to +85°C
- 128 K EEPROM
- APIN 1 disabled
- GSM XOR/3G test algorithm
- Creation of new data fields allowed
- 2FF (plug-in), 3FF (mini-UICC)
- Repluggable card
| 128K/J LTE Test (U)SIM – Mini-UICC | |
|---|---|
| Art. No. | 10432006 |
| Dimension | 85 mm x 54 mm |
