32K GSM Phase 2+ Standard 1 Test SIM
- Phase 2+ data fields
- 3 V / 5 V technology
- Temperature –25°C to +85°C
- XOR test algorithm
- 32 K EEPROM
- PIN 1 enabled
- Creation of new data fields allowed
- 2FF (plug-in)
| 32K GSM Phase 2+ Standard 1 Test SIM | |
|---|---|
| Art. No. | 10332001 |
| Dimension | 85 mm x 54 mm |
