64K/J Test (U)SIM 1.8 V – Mini-UICC

64K/J Test (U)SIM 1.8 V – Mini-UICC
  • UICC multi-application platform
  • Two applications: Test SIM and Test USIM
  • Based on Java Card™ Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC)
  • Repluggable card
64K/J Test (U)SIM 1.8 V – Mini-UICC
Art. No. 10432004
Dimension 85 mm x 54 mm

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