Discover how to monitor, trace, and debug multiple active profiles with confidence.

With Multiple Enabled Profiles (MEP), eSIM architectures are becoming significantly more complex. Parallel profiles, dynamic switching, and increased signaling flows create new challenges for visibility and control.

In this webinar, we explore how MEP is transforming the way engineers monitor and analyze eSIM behavior—and how advanced tracing helps uncover what’s really happening inside the device and network.

What you will learn

• What is MEP and why is this feature relevant now?

• How can MEP be tested, and how is this done during development?

• The value of comprehensive eSIM tracing and monitoring tools

• Where is the industry heading – and what new use cases are emerging?

Webinar Details:

• Format: GoToWebinar live online session (45 minutes + 15 minutes Q&A)
• Date: Tuesday, July 7
• Time: 3:00 PM UTC
  View webinar time in your local timezone (external link): No Time Zone 

Can’t make it at 3:00 PM?Join the 07:00 AM edition. And even if you can’t attend live, register anyway, as all registrants will receive access to the recording after the session. 

For more information about our eSIM tracing tool, visit the product page. Want to discuss this topic further? Reach out to our presenter Andras Talas at atalas@comprion.com.