Test Solutions for NFC Forum digital conformance testing

UT³ Platform high precision measurement tool with screen and connectors front

Automated Test Solution NFC Forum Digital

Meet our NFC Forum Digital Test Solution, a powerful test platform that effectively supports all test cases described in NFC Forum's Digital Protocol Test Specification. Our Device Test Center test suite, on which all test cases are automatically executed, operates on our proprietary hardware. We offer it together with the UT³ Platform, which has been validated and approved by the NFC Forum, or together with CL Verify A, a cost-effective tool that can run the same test cases, making it the perfect companion for the development phase and preparation for certification in a lab.

NFC Forum-approved test solutions for NFC certification, based on the conformance platform UT³ Platform and control software Device Test Center:

NFC Forum WLC-L Type 2 Tag
NFC Forum WLC-P Type 2 Tag
NFC Forum WLC-L Type 5 Tag
NFC Forum WLC-P Type 5 Tag
NFC Forum Digital Protocol
NFC Forum Tag Test Bench (Tag Operation)
NFC Forum LLCP (Logical Link Control Protocol)
NFC Forum SNEP (Simple NDEF Exchange Protocol)

Write Your Own Test Cases

The NFC Test Designer feature enables testers to create custom NFC test cases without the need for advanced programming skills. Easily design tests, execute them, and analyze the results. Integrated with COMPRION’s powerful Device Test Center, it supports in-depth analysis while helping you expand test coverage and strengthen overall quality assurance. The built-in Test Step Editor allows you to create and modify test steps in XML with code completion for faster, clearer editing, while the NFC Analyzer Editor lets you develop analyzer scripts in JavaScript for verdict generation.

Hardware Options