Use Cases Include:
Advanced Test Case Management Software for Smart Cards and eSIM Solutions
Connectivity Test Center is COMPRION’s test case management software for testing smart cards, secure elements (on-chip), and all entities involved in remote SIM provisioning (RSP) of embedded SIMs. It is perfectly suited for manufacturers of smart cards, chips, devices, and servers as well as network operators who need to validate their (e)UICC-based services and solutions. Additionally, it helps to comply with current international standards and supports product development by increasing resilience against real-world challenges.
As the adjacent graphic shows, Connectivity Test Center can communicate with soldered eUICCs, unsoldered SIMs and eSIMs as well as with RSP backend servers (SM-DP, SM-SR).
Test Plan Management
Connectivity Test Center provides a repository of available test benches from which you can select, and allows to create test plans tailored to your specific requirements. For each implementation under test (IUT), you can define a set of parameters that serve as input for the test procedure. Based on these parameters, only the relevant test cases from the selected test benches are executed, significantly reducing the number of test runs, overall test duration, and the time required for analyzing the results.
Test Reporting & Results
Once the test procedure is complete, the results of each individual test case are presented both separately and in a summary format. With a single click, you can access detailed results for any test case, including specific information about the error causes for failed tests. Additionally, you can show monitoring data that presents all communication data recorded during the test in separate views for easier interpretation. This is very helpful in troubleshooting when tests do not pass.
Unrivaled Look into Data Communication on All Layers
Monitoring by COMPRION means that the recorded data is processed in different layers. The complete data stream is available at a single glance, with bits and bytes translated into the appropriate format for all layers, so that the recorded data is easy to understand. Fast orientation in the recorded log file is made possible through the synchronization of individual layer views - selecting content within one layer automatically synchronizes the views of all layers. Additionally, zoom features provide detailed close-ups of incidents on the physical layer.
Our terminal simulator for smart card testing and tracing is the ideal companion for preparing for validation in the laboratory.
Our conformance platform for smart card testing with digital and analog test and measurement abilities - Qualified by GlobalPlatform.
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