GSM XOR/3G Test Algorithm
64K/J Test (U)SIM – Plug-in
Prod. No.: 10432002 UICC multi-application platform Two applications: Test SIM and Test USIM Based on Java CardTM Open Platform technology 1.8 V / 3 V / 5 V Temperature –25°C to +85°C 64K EEPROM APIN 1 disabled GSM XOR/3G test algorithm Creation of new data fields allowed 2FF (plug-in) Show details
GSM XOR/3G Test Algorithm
64K/J Test (U)SIM – Mini-UICC
Prod. No.: 10432004
UICC multi-application platform Two applications: Test SIM and Test USIM Based on Java CardTM Open Platform technology 1.8 V / 3 V / 5 V Temperature –25°C to +85°C 64K EEPROM APIN 1 disabled GSM XOR/3G test algorithm Creation of new data fields allowed 2FF (plug-in), 3FF (mini-UICC) Repluggable card Show details
