GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

64K/J Test (U)SIM – Mini-UICC

Prod. No.: 10432004
  • UICC multi-application platform
  • Two applications: Test SIM and Test USIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC) 
  • Repluggable card

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