September 01, 2015

COMPRION Test (U)SIMs Smart – Flexible – Reliable

If you need a high-quality smart card for testing purposes, then we are pleased to offer you our top-selling Test (U)SIMs. The smart cards are ready for use, but you can also easily configure them and hence adopt them to your needs.

Our Test (U)SIMs enable the user to comprehensively examine the functionalities of a mobile device and the correct interaction with the card without having access to a live network. Some of the biggest customer groups are handset manufacturers, test and system houses and mobile phone repair companies.

All Test (U)SIMs and accessories for our test solutions can also easily be purchased through our web shop. Once you have registered and your account has been activated, you will be able to shop 24 hours a day, wherever you are, paying easily by MasterCard or VISA.


Our Test (U)SIM portfolio covers:

  • Applications: SIM, USIM, ISIM
  • Formats: 2FF (Plug-IN), 3FF (Mini-UICC), 4FF (Nano)
  • Voltages: 1.8 V, 3 V, 5 V
  • Temperature resistances:
    -25 °C to +85 °C
    -40 °C to +105 °C
  • Sizes: 8 K, 32 K, 64 K, 128 K
  • Algorithms: 2G XOR/3G Test Algorithm, MILENAGE Algorithm
  • Technologies: GSM, UMTS/W-CDMA, LTE

Discover our web shop! 24/7

Author: Daniela Wittkamp, Product Manager for File Tree Express and Test (U)SIMs

Download Testability Times 2015


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