XOR Test Algorithm
8K GSM Phase 2 Test SIM
Prod. No.: 10208007 Phase 2 data fields 3 V / 5 V technology Temperature –25°C to +85°C XOR test algorithm 8K EEPROM PIN 1 disabled 2FF (plug-in)
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XOR Test Algorithm
32K GSM Phase 2+ Standard 1 Test SIM
Prod. No.: 10332001 Phase 2+ data fields 3 V / 5 V technology Temperature –25°C to +85°C XOR test algorithm 32K EEPROM PIN 1 enabled Creation of new data fields allowed 2FF (plug-in)
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XOR Test Algorithm
64K/J GSM Phase 2+ 1.8 V Test SIM
Prod. No.: 10332005 Phase 2+ data fields 1.8 V / 3 V / 5 V technology Temperature –25°C to +85°C Java CardTM XOR test algorithm 64K EEPROM PIN 1 disabled Creation of new data fields allowed 2FF (plug-in)
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