XOR Test Algorithm
![XOR Test Algorithm]()
8K GSM Phase 2 Test SIM
Prod. No.: 10208007- Phase 2 data fields
- 3 V / 5 V technology
- Temperature –25°C to +85°C
- XOR test algorithm
- 8K EEPROM
- PIN 1 disabled
- 2FF (plug-in)
Buy
XOR Test Algorithm
![XOR Test Algorithm]()
32K GSM Phase 2+ Standard 1 Test SIM
Prod. No.: 10332001- Phase 2+ data fields
- 3 V / 5 V technology
- Temperature –25°C to +85°C
- XOR test algorithm
- 32K EEPROM
- PIN 1 enabled
- Creation of new data fields allowed
- 2FF (plug-in)
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XOR Test Algorithm
![XOR Test Algorithm]()
64K/J GSM Phase 2+ 1.8 V Test SIM
Prod. No.: 10332005- Phase 2+ data fields
- 1.8 V / 3 V / 5 V technology
- Temperature –25°C to +85°C
- Java CardTM
- XOR test algorithm
- 64K EEPROM
- PIN 1 disabled
- Creation of new data fields allowed
- 2FF (plug-in)
Buy
