XOR Test Algorithm

XOR Test Algorithm

8K GSM Phase 2 Test SIM

Prod. No.: 10208007
  • Phase 2 data fields
  • 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • XOR test algorithm
  • 8K EEPROM
  • PIN 1 disabled
  • 2FF (plug-in)

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XOR Test Algorithm

XOR Test Algorithm

32K GSM Phase 2+ Standard 1 Test SIM

Prod. No.: 10332001
  • Phase 2+ data fields
  • 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • XOR test algorithm
  • 32K EEPROM
  • PIN 1 enabled
  • Creation of new data fields allowed
  • 2FF (plug-in)

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XOR Test Algorithm

XOR Test Algorithm

64K/J GSM Phase 2+ 1.8 V Test SIM

Prod. No.: 10332005
  • Phase 2+ data fields
  • 1.8 V / 3 V / 5 V technology
  • Temperature –25°C to +85°C
  • Java CardTM
  • XOR test algorithm
  • 64K EEPROM
  • PIN 1 disabled
  • Creation of new data fields allowed
  • 2FF (plug-in)

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