GSM XOR/3G test algorithm

GSM XOR/3G test algorithm

128K/J LTE Test (U)SIM – MFF2 - M2M UICC

Prod. No.: 10432010
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature (TB) –40°C to +105°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • MFF2 - M2M Form Factor #2 - 6x5mm
  • Native UICC (no eUICC)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE CTS Test (U)SIM – 4FF

Prod. No.: 10432009
  • ARF support for Android UICC Carrier Privileges CTS tests
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

64K/J LTE Test (U)SIM – Plug-in – M2M UICC

Prod. No.: 10432008
  • UICC multi-application platform
  • New LTE data fields implemented
  • Two applications: Test SIM, Test USIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature (TB) –40°C to +105°C
  • 64K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE Test (U)SIM – 4FF

Prod. No.: 10432007
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE Test (U)SIM – Mini-UICC

Prod. No.: 10432006
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC)
  • Repluggable card

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GSM XOR/3G Test Algorithm

GSM XOR/3G Test Algorithm

128K/J LTE Test (U)SIM – Plug-in

Prod. No.: 10432005
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • GSM XOR/3G test algorithm
  • Creation of new data fields allowed 
  • 2FF (plug-in)

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Milenage Algorithm

Milenage Algorithm

128K/J LTE MILENAGE Test (U)SIM – Mini-UICC

Prod. No.: 10532000
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • MILENAGE algorithm
  • Creation of new data fields allowed
  • 2FF (plug-in), 3FF (mini-UICC) 
  • Repluggable card

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Milenage Algorithm

Milenage Algorithm

128K/J LTE MILENAGE Test (U)SIM – 4FF

Prod. No.: 10532001
  • UICC multi-application platform
  • New LTE data fields implemented
  • Three applications: Test SIM, Test USIM, Test ISIM
  • Based on Java CardTM Open Platform technology
  • 1.8 V / 3 V / 5 V
  • Temperature –25°C to +85°C
  • 128K EEPROM
  • APIN 1 disabled
  • MILENAGE algorithm
  • Creation of new data fields allowed
  • 4FF (nano)

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