GSM XOR/3G test algorithm
128K/J LTE Test (U)SIM – MFF2 - M2M UICC
Prod. No.: 10432010 UICC multi-application platform New LTE data fields implemented Three applications: Test SIM, Test USIM, Test ISIM Based on Java CardTM Open Platform technology 1.8 V / 3 V / 5 V Temperature (TB) –40°C to +105°C 128K EEPROM APIN 1 disabled GSM XOR/3G test algorithm Creation of new data fields allowed MFF2 - M2M Form Factor #2 - 6x5mm Native UICC (no eUICC ) Buy
GSM XOR/3G Test Algorithm
128K/J LTE Test (U)SIM – 4FF
Prod. No.: 10432007 UICC multi-application platform New LTE data fields implemented Three applications: Test SIM, Test USIM, Test ISIM Based on Java CardTM Open Platform technology 1.8 V / 3 V / 5 V Temperature –25°C to +85°C 128K EEPROM APIN 1 disabled GSM XOR/3G test algorithm Creation of new data fields allowed 4FF (nano) Buy
GSM XOR/3G Test Algorithm
128K/J LTE Test (U)SIM – Mini-UICC
Prod. No.: 10432006 UICC multi-application platform New LTE data fields implemented Three applications: Test SIM, Test USIM, Test ISIM Based on Java CardTM Open Platform technology 1.8 V / 3 V / 5 V Temperature –25°C to +85°C 128K EEPROM APIN 1 disabled GSM XOR/3G test algorithm Creation of new data fields allowed 2FF (plug-in), 3FF (mini-UICC) Repluggable card Buy
GSM XOR/3G Test Algorithm
128K/J LTE Test (U)SIM – Plug-in
Prod. No.: 10432005 UICC multi-application platform New LTE data fields implemented Three applications: Test SIM, Test USIM, Test ISIM Based on Java CardTM Open Platform technology 1.8 V / 3 V / 5 V Temperature –25°C to +85°C 128K EEPROM APIN 1 disabled GSM XOR/3G test algorithm Creation of new data fields allowed 2FF (plug-in) Buy
Milenage Algorithm
128K/J LTE MILENAGE Test (U)SIM – Mini-UICC
Prod. No.: 10532000 UICC multi-application platform New LTE data fields implemented Three applications: Test SIM, Test USIM, Test ISIM Based on Java CardTM Open Platform technology 1.8 V / 3 V / 5 V Temperature –25°C to +85°C 128K EEPROM APIN 1 disabled MILENAGE algorithm Creation of new data fields allowed 2FF (plug-in), 3FF (mini-UICC) Repluggable card Buy
GSM XOR/3G Test Algorithm
128K/J LTE CTS Test (U)SIM – 4FF
Prod. No.: 10432009 ARF support for Android UICC Carrier Privileges CTS tests UICC multi-application platform New LTE data fields implemented Three applications: Test SIM, Test USIM, Test ISIM Based on Java CardTM Open Platform technology 1.8 V / 3 V / 5 V Temperature –25°C to +85°C 128K EEPROM APIN 1 disabled GSM XOR/3G test algorithm Creation of new data fields allowed 4FF (nano) Buy
