GSM XOR/3G test algorithm
![GSM XOR/3G test algorithm]()
128K/J LTE Test (U)SIM – MFF2 - M2M UICC
Prod. No.: 10432010- UICC multi-application platform
- New LTE data fields implemented
- Three applications: Test SIM, Test USIM, Test ISIM
- Based on Java CardTM Open Platform technology
- 1.8 V / 3 V / 5 V
- Temperature (TB) –40°C to +105°C
- 128K EEPROM
- APIN 1 disabled
- GSM XOR/3G test algorithm
- Creation of new data fields allowed
- MFF2 - M2M Form Factor #2 - 6x5mm
- Native UICC (no eUICC)
Out of Stock
GSM XOR/3G Test Algorithm
![GSM XOR/3G Test Algorithm]()
128K/J LTE Test (U)SIM – 4FF
Prod. No.: 10432007- UICC multi-application platform
- New LTE data fields implemented
- Three applications: Test SIM, Test USIM, Test ISIM
- Based on Java CardTM Open Platform technology
- 1.8 V / 3 V / 5 V
- Temperature –25°C to +85°C
- 128K EEPROM
- APIN 1 disabled
- GSM XOR/3G test algorithm
- Creation of new data fields allowed
- 4FF (nano)
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GSM XOR/3G Test Algorithm
![GSM XOR/3G Test Algorithm]()
128K/J LTE Test (U)SIM – Mini-UICC
Prod. No.: 10432006- UICC multi-application platform
- New LTE data fields implemented
- Three applications: Test SIM, Test USIM, Test ISIM
- Based on Java CardTM Open Platform technology
- 1.8 V / 3 V / 5 V
- Temperature –25°C to +85°C
- 128K EEPROM
- APIN 1 disabled
- GSM XOR/3G test algorithm
- Creation of new data fields allowed
- 2FF (plug-in), 3FF (mini-UICC)
- Repluggable card
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GSM XOR/3G Test Algorithm
![GSM XOR/3G Test Algorithm]()
128K/J LTE Test (U)SIM – Plug-in
Prod. No.: 10432005- UICC multi-application platform
- New LTE data fields implemented
- Three applications: Test SIM, Test USIM, Test ISIM
- Based on Java CardTM Open Platform technology
- 1.8 V / 3 V / 5 V
- Temperature –25°C to +85°C
- 128K EEPROM
- APIN 1 disabled
- GSM XOR/3G test algorithm
- Creation of new data fields allowed
- 2FF (plug-in)
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Milenage Algorithm
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128K/J LTE MILENAGE Test (U)SIM – Mini-UICC
Prod. No.: 10532000- UICC multi-application platform
- New LTE data fields implemented
- Three applications: Test SIM, Test USIM, Test ISIM
- Based on Java CardTM Open Platform technology
- 1.8 V / 3 V / 5 V
- Temperature –25°C to +85°C
- 128K EEPROM
- APIN 1 disabled
- MILENAGE algorithm
- Creation of new data fields allowed
- 2FF (plug-in), 3FF (mini-UICC)
- Repluggable card
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GSM XOR/3G Test Algorithm
![GSM XOR/3G Test Algorithm]()
128K/J LTE CTS Test (U)SIM – 4FF
Prod. No.: 10432009- ARF support for Android UICC Carrier Privileges CTS tests for Android 11 and lower
- UICC multi-application platform
- New LTE data fields implemented
- Three applications: Test SIM, Test USIM, Test ISIM
- Based on Java CardTM Open Platform technology
- 1.8 V / 3 V / 5 V
- Temperature –25°C to +85°C
- 128K EEPROM
- APIN 1 disabled
- GSM XOR/3G test algorithm
- Creation of new data fields allowed
- 4FF (nano)
Buy
