May 06, 2025
COMPRION has expanded its analog test bench portfolio in accordance with ETSI TS 102 230-1 to include the new voltage class, Class D (1.2 volts) – a key milestone in the development and testing of devices and chipsets with integrated eSIMs (eUICCs). This update is based on the current specification version V17.2.0 (2024-07).
The test bench runs on the established UT³ Platform and enables device and chipset manufacturers in particular to thoroughly verify the electrical behavior of the eUICC interface throughout all stages of development. By soldering an adapter onto the eSIM interface, direct access to the test system is possible – enabling developers to detect and resolve interoperability issues at an early stage.
“With the new Class D test bench, our customers save valuable time in the development process – because they can identify issues exactly where they arise,” says Dr. Marcus Dormanns, Director of Product Management & Business Development at COMPRION.
Once again, COMPRION is setting industry standards – as the only provider able to offer a Class D eSIM product based on an ETSI 102 230-1 test solution for SIM cards that is recognized by both key mobile device conformance test organizations – GCF and PTCRB – for its proven accuracy.
For more information about the new ETSI 102 230-1 Class D test bench, please contact our sales team.
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