Press Releases

October 26, 2026

NXP MIFARE, COMPRION and AdvanIDe Demonstrate NFC Performance Testing for Digital Car Keys

At the NXP Tech Days in Detroit on October 28–29, 2026, COMPRION and AdvanIDe jointly demonstrate how NFC communication between digital car keys and NFC readers installed in or on a vehicle can be analyzed and optimized. Using COMPRION's test solution and NFC inlay solutions from AdvanIDe, the companies show how reader selection, installation position, surrounding materials, antenna and inlay design, and the final credential form factor can affect NFC performance under real-world conditions.

NFC plays an important role in modern vehicle access systems. In addition to smartphone-based digital car keys, secure NFC cards like MIFARE DESFire EV3 can serve as an alternative or additional means of access, for example when handing over a vehicle for valet parking, lending it to friends, or taking it in for service.

AdvanIDe supports these applications with NFC semiconductor expertise and inlay solutions that can be adapted to different form factors and customer requirements, including IC selection, antenna and inlay design, and chip encoding. This allows automotive customers to evaluate different NFC configurations early in the design process and select an inlay solution that fits the performance requirements of the final application. 

Even when both NFC readers and NFC cards have successfully passed their respective conformance tests, reliable communication in real-world applications is not automatically guaranteed. Factors such as the installation position of the reader or antenna, for example in a door handle or center console, surrounding materials, antenna geometry, inlay design and the size and form factor of the NFC credential can significantly affect communication performance.

Making NFC Performance Visible

At the NXP Tech Days hosted by NXP® Semiconductors, COMPRION, MIFARE and AdvanIDe will demonstrate how these effects can be measured and visualized using the COMPRION Design Validation Center.

The test solution combines a robotic positioning system with MIFARE card technology and an automotive NFC reader, such as one integrated into a vehicle door handle. The robot automatically moves the card through a predefined measurement volume, identifying the positions at which NFC communication becomes possible. The measurement results are used to create a three-dimensional visualization of the NFC operating volume, showing the spatial area in which the card and reader can reliably communicate. 

The demonstration brings together an NXP NFC reader IC and a MIFARE digital key card solution, highlighting the importance of evaluating reader and card performance together in the intended vehicle environment.

The results help developers better understand NFC performance under realistic conditions, identify potential limitations early on, and optimize reader selection and positioning for the specific vehicle application.

From Conformance Testing to Real-World Performance

Even when both the card and reader comply with the relevant standards, their communication can be affected by the actual installation environment. In addition, the complete end-to-end solution is tested using real components, such as antennas, and is also applicable to mobile devices acting as digital keys. 

By combining AdvanIDe's expertise in NFC semiconductor technologies, antenna and inlay design, component selection, and chip encoding with COMPRION's measurement and validation technology, the two companies demonstrate how automotive manufacturers and suppliers can evaluate complete NFC implementations, identify performance limitations early, and optimize contactless vehicle access systems before final integration.

The joint demonstration will take place at the NXP Tech Days Detroit on October 28–29, 2026, at Saint John's Resort in Plymouth, Michigan. Organized by NXP Semiconductors, the technical event brings together engineers, technology experts, and leading companies from the automotive industry to explore the latest technological developments and applications.


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