Press Releases

July 21, 2016

NFC Forum Approves COMPRION Solution for Test Release 2015-B

COMPRION UT³ Platform is the first test tool validated to NFC Forum Test Release 2015-B. The new test release includes updates in support of existing technical specifications, but also integrates a number of new requirements. With the validation complete, COMPRION’s NFC test solution supports new specification versions namely Activity V1.1, Digital Protocol V1.1, Analog V1.1, and LLCP V1.2.


The changes in the “Activity” technical specification have had a big impact on the new test release. The activity layer defines the fundamental procedures for setting up a communication protocol between two NFC devices. As there is no separate test specification for this layer, changes in the “Activity” specification affect the test cases of the layers (Digital Protocol, LLCP, and SNEP) above it. In total, more than two thousand tests and subtests had to be amended.


Ralph Kamp, Product Manager for NFC Test Solutions at COMPRION explains, “The NFC Forum is the most important standardization body for NFC technology. That’s why we have actively supported and promoted the specification from the very beginning. It has been important for us that the new TR2015-B is also implemented immediately into our tool so that our customers’ systems are always up-to-date. This ensures that the latest NFC developments of chipset and device manufacturers conform to the specifications, and work reliably.


“The success of NFC is built upon the assurance of a fast, consistent, and reliable user experience,” said Paula Hunter, executive director of the NFC Forum. “By incorporating the NFC Forum’s latest specifications into its test tool, COMPRION is at the forefront of providing that assurance. We at the NFC Forum greatly appreciate COMPRION’s efforts to confirm that NFC-enabled devices are delivering NFC functionality at the highest quality standards."
 

 


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